原子間力顕微鏡の基礎１：基礎 Fundamentals of Atomic Force Microscopy - Part I: Foundations (Lessons from Nanoscience: a Lecture Notes Series)

Reifenberger, Ronald G

World Scientific Publishing Co Pte Ltd（2015/11発売）

• 製本 Hardcover:ハードカバー版／ページ数 340 p.
• 言語 ENG
• 商品コード 9789814630344
• DDC分類 620.5

Full Description

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to "Fundamentals of AFM", an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Contents

Introduction to Scanning Probe Microscopy; The Force between Molecules; Simple Models for Molecule-Molecule Interactions; van der Waals Interactions between Macroscopic Objects; When the Tip Contacts the Substrate: Contact Mechanics; Quasi-Static Cantilever Mechanics; AFM System Components; Contact Mode AFM; Experimental Calibrations; Computer-Aided AFM Simulations;