Mutation Testing for the New Century (The Kluwer International Series on Advances in Database Systems)

Wong, W. Eric (EDT)/ Mutation 200 (2000 San Jose, Calif.)

Kluwer Academic Pub（2001/07発売）

• 製本 Hardcover:ハードカバー版／ページ数 136 p.
• 言語 ENG
• 商品コード 9780792373230
• DDC分類 005.14

基本説明

Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation. This book brings together cutting edge research results in mutation testing.

Full Description

Extensive research and development has produce mutation tools for languages such as Fortran, Ada, C, and IDL; empirical evaluations comparing mutation with other test adequacy criteria; empirical evidence and theoretical justification for the coupling effect; and techniques for speeding up mutation testing using various types of high performance architectures. Mutation has received the attention of software developers and testers in such diverse areas as network protocols and nuclear simulation. This volume brings together up-to-date research results in mutation testing from a wide range of researchers. It provides answers to key questions related to mutation and raises questions yet to be answered.