Optics of Charged Particles （2ND）

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Optics of Charged Particles （2ND）

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  • 製本 Paperback:紙装版/ペーパーバック版／ページ数 318 p.
  • 言語 ENG
  • 商品コード 9780128186527
  • DDC分類 539.72112

Full Description

Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science.

The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments.

By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments.

Contents

1. Gaussian Optics and Transfer Matrices2. General Relations for the Motion of Charged Particles in Electromagnetic Fields3. Quadrupole Lenses4. Sector Fields5. Charged Particle Beams in Phase Space6. Particle Beams in Periodic Structures7. Fringing Fields8. Image Aberrations9. Design of Particle Spectrometers and Beam Guide Lines10. Time-of-Flight Mass Spectrographs