Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics) (3RD)
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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics) (3RD)  Hardcover,  言語:ENG

Breitenstein, Otwin/ Warta, Wilhelm/ Schubert, Martin C.

  • ウェブストア価格 ¥39,787(本体¥36,170)
  • Springer International Publishing AG(2019/01発売)
  • ポイント 361pt
  • 海外取次在庫